IMPAC MIKRON M315X黑体辐射源/*校正器

IMPAC MIKRON M315X黑体辐射源/*校正器

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具体成交价以合同协议为准
2018-03-09 12:30:08
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达兴昌科技(深圳)有限公司

达兴昌科技(深圳)有限公司

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产品简介

M 315 X (X4, X6, X8, X12)
Large area sources for calibrating thermal imaging systems, aerial mapping / surveillance equipment and spectrophotometers.
(Ambient +5) ... 400°C

详细介绍

M 315 X (X4, X6, X8, X12)

Large area sources for calibrating thermal imaging systems, aerial mapping / surveillance equipment and spectrophotometers.
(Ambient +5) ... 400°C


Heated emitter shape:
Thermally uniform plate

Emissivity:
effective = 1.00
at 8...14 µm
(For emissivities of other wavelength temperature correction tables are available)

Standard calibration method:
pyrometric
(Large area calibration sources with temperatures up to 400°C can optionally be calibrated thermometrically.)

Surface area: 
M 315 X4: 101 x 101 mm
M 315 X6: 152 x 152 mm
M 315 X8: 204 x 204 mm
M 315 X12: 305 x 305 mm

Temperature uncertainty: 
1°C (<100°C) to 1.3°C (at 400°C)

Average warm-up time:
60 min (to 400°C)

Dimensions [mm] (HxD) / Weight:
X4: 280 x 254 x 280 to X12: 510 x 660 x 585
Controller module: 178 x 483 x 593

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